Thermal resistance measurement of edge-emitting semiconductor lasers using spontaneous emission spectra
نویسندگان
چکیده
An improved technique for thermal resistance measurement of edge-emitting diode lasers using spontaneous emission spectra, collected through the opening in n-contact within range operating currents, has been proposed. The advantage proposed is that systematic errors typical measurements based on lasing spectra are excluded. accuracy method was verified by measuring dependence cavity length with 100 μm strip width. Obtained results good agreement model, and minimum error ±0.1 K/W. can be used metrological support fabrication process semiconductor lasers. Keywords: laser diode, resistance, emission.
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ژورنال
عنوان ژورنال: Fizika i tehnika poluprovodnikov
سال: 2022
ISSN: ['0015-3222', '1726-7315']
DOI: https://doi.org/10.21883/sc.2022.12.55152.4409